• DocumentCode
    3032125
  • Title

    Total dose and single event testing of the Intersil ISL70227RH low-noise operational amplifier

  • Author

    van Vonno, N.W. ; Pearce, L.G. ; Hood, R. ; Thomson, E.T. ; Bernard, T.M. ; Chesley, P.J.

  • Author_Institution
    Intersil Corp., Melbourne, FL, USA
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    858
  • Lastpage
    862
  • Abstract
    We report the results of low and high dose rate total dose and SEE testing of the Intersil ISL70227RH low-noise operational amplifier together with a discussion of the part´s electrical specifications and wafer fabrication process.
  • Keywords
    circuit testing; low noise amplifiers; operational amplifiers; radiation hardening (electronics); Intersil ISL70227RH low-noise operational amplifier; SEE testing; part electrical specifications; single event testing; total dose testing; wafer fabrication process; Fabrication; Noise; Operational amplifiers; Plastics; Radiation effects; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131317
  • Filename
    6131317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3032125