DocumentCode :
3032125
Title :
Total dose and single event testing of the Intersil ISL70227RH low-noise operational amplifier
Author :
van Vonno, N.W. ; Pearce, L.G. ; Hood, R. ; Thomson, E.T. ; Bernard, T.M. ; Chesley, P.J.
Author_Institution :
Intersil Corp., Melbourne, FL, USA
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
858
Lastpage :
862
Abstract :
We report the results of low and high dose rate total dose and SEE testing of the Intersil ISL70227RH low-noise operational amplifier together with a discussion of the part´s electrical specifications and wafer fabrication process.
Keywords :
circuit testing; low noise amplifiers; operational amplifiers; radiation hardening (electronics); Intersil ISL70227RH low-noise operational amplifier; SEE testing; part electrical specifications; single event testing; total dose testing; wafer fabrication process; Fabrication; Noise; Operational amplifiers; Plastics; Radiation effects; Testing; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131317
Filename :
6131317
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3032125
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