• DocumentCode
    3032215
  • Title

    Molecular Dynamics Simulation of Octadecaborane Implantation into Silicon

  • Author

    Marqués, Luis A. ; Pelaz, Lourdes ; Santos, Iván ; López, Pedro ; Aboy, María ; Venezia, Vincent C.

  • Author_Institution
    Univ. de Valladolid, Valladolid
  • fYear
    2007
  • fDate
    Jan. 31 2007-Feb. 2 2007
  • Firstpage
    44
  • Lastpage
    47
  • Abstract
    We have carried out molecular dynamics simulations of monatomic B and octadecaborane cluster implantations into Si in order to make a comparative study and determine the advantages and drawbacks of each approach when used to fabricate shallow junctions. We have simulated a total of 1000 cascades of monatomic boron and an equivalent of 56 cascades of octadecaborane in order to have good statistics. We have obtained and analyzed the doping profiles and the amount and morphology of the damage produced within the target. Our simulation results indicate that the use of octadecaborane clusters for the implantation process shows several advantages with respect to monatomic B beams, mainly related to the reduction of channeling and the lower amount of residual damage at the end of range.
  • Keywords
    boron; doping profiles; elemental semiconductors; ion implantation; molecular dynamics method; semiconductor doping; semiconductor junctions; silicon; B; Si; doping profiles; elemental semiconductors; ion implantation process; molecular dynamics simulation; monatomic boron; octadecaborane implantation; residual damage; shallow junctions; silicon; Boron; Doping profiles; Fabrication; Hydrogen; Ion implantation; MOSFET circuits; Silicon; Statistics; Surface morphology; Telecommunications; Electronics; Molecular dynamics; Silicon; Simulation; Tecnology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices, 2007 Spanish Conference on
  • Conference_Location
    Madrid
  • Print_ISBN
    1-4244-0868-7
  • Type

    conf

  • DOI
    10.1109/SCED.2007.383992
  • Filename
    4271164