DocumentCode
3032215
Title
Molecular Dynamics Simulation of Octadecaborane Implantation into Silicon
Author
Marqués, Luis A. ; Pelaz, Lourdes ; Santos, Iván ; López, Pedro ; Aboy, María ; Venezia, Vincent C.
Author_Institution
Univ. de Valladolid, Valladolid
fYear
2007
fDate
Jan. 31 2007-Feb. 2 2007
Firstpage
44
Lastpage
47
Abstract
We have carried out molecular dynamics simulations of monatomic B and octadecaborane cluster implantations into Si in order to make a comparative study and determine the advantages and drawbacks of each approach when used to fabricate shallow junctions. We have simulated a total of 1000 cascades of monatomic boron and an equivalent of 56 cascades of octadecaborane in order to have good statistics. We have obtained and analyzed the doping profiles and the amount and morphology of the damage produced within the target. Our simulation results indicate that the use of octadecaborane clusters for the implantation process shows several advantages with respect to monatomic B beams, mainly related to the reduction of channeling and the lower amount of residual damage at the end of range.
Keywords
boron; doping profiles; elemental semiconductors; ion implantation; molecular dynamics method; semiconductor doping; semiconductor junctions; silicon; B; Si; doping profiles; elemental semiconductors; ion implantation process; molecular dynamics simulation; monatomic boron; octadecaborane implantation; residual damage; shallow junctions; silicon; Boron; Doping profiles; Fabrication; Hydrogen; Ion implantation; MOSFET circuits; Silicon; Statistics; Surface morphology; Telecommunications; Electronics; Molecular dynamics; Silicon; Simulation; Tecnology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2007 Spanish Conference on
Conference_Location
Madrid
Print_ISBN
1-4244-0868-7
Type
conf
DOI
10.1109/SCED.2007.383992
Filename
4271164
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