DocumentCode
3032235
Title
Laser tests on a power operational amplifier
Author
Palomar, C. ; López-Calle, I. ; Franco, F.J. ; Izquierdo, J.G. ; Agapito, J.A.
Author_Institution
Dept. de Fis. Aplic. III, Univ. Complutense de Madrid (UCM), Madrid, Spain
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
889
Lastpage
893
Abstract
Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good candidate to develop power systems to be used in radiation environments.
Keywords
integrated circuit testing; laser beam applications; operational amplifiers; power amplifiers; radiation effects; laser test; power operational amplifier; power system; radiation environments; single event transients; Junctions; Lasers; Power supplies; Resistors; Transient analysis; Transistors; Laser irradiation; OPA541; operational amplifiers; power devices; single event transients; single-photon absorption;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131322
Filename
6131322
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