DocumentCode
3032329
Title
The fault dropping problem in concurrent event driven simulation
Author
Gai, Silvano ; Montessoro, Pier Luca
Author_Institution
CENS-CNR, Politecnico di Torino, Italy
fYear
1990
fDate
17-19 Sep 1990
Firstpage
298
Lastpage
301
Abstract
A technique, referred to as asynchronous fault dropping, is discussed. It is based on the concept of removing descriptors while the simulation procedures access the data structure. This technique guarantees the maximum efficiency in reducing the computational effort. Experimental results show that it can considerably speed up simulation, particularly for large networks. Lastly, consideration is given to the possibility of using a mixed approach in the light of the dynamic memory requirement during the initialization phase. It is shown that combination of synchronous and asynchronous fault dropping can optimize the total amount of memory needed
Keywords
circuit analysis computing; logic CAD; asynchronous fault dropping; computational effort; concurrent event driven simulation; data structure; dynamic memory requirement; initialization phase; Benchmark testing; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Discrete event simulation; Electrical fault detection; Fault detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1990. ICCD '90. Proceedings, 1990 IEEE International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-2079-X
Type
conf
DOI
10.1109/ICCD.1990.130232
Filename
130232
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