Title :
SEE transient response of Crane Electronics Single Output Point of Load DC-DC Converters
Author :
Sanders, Anthony B. ; Chen, Dakai ; Kim, Hak S. ; Phan, Anthony M. ; Nkei, Bertrand ; Kristjansson, Stefan
Author_Institution :
NASA Goddard Space Flight Center (GSFC), Greenbelt, MD, USA
Abstract :
This study was undertaken to determine the Single Event Effect (SEE) and transient susceptibility of the Crane Electronics Maximum Flexible Power (MFP) Single Output Point of Load DC/DC Converters, for transient interruptions in the output signal and for destructive and non-destructive events induced by exposing it to a heavy ion beam.
Keywords :
DC-DC power convertors; ion beam effects; transient response; SEE transient response; crane electronics maximum flexible power; crane electronics single output point; destructive events; heavy ion beam; load DC-DC converters; nondestructive events; single event effect; transient susceptibility; Cranes; Electronic mail; Load modeling; Loading; NASA; Testing; Transient analysis;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131327
