Radiation characterization of a dual core LEON3-FT processor

Author

Sturesson, F. ; Gaisler, J. ; Ginosar, R. ; Liran, T.

Author_Institution

AeroflexGaisler AB, Gothenburg, Sweden

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

938

Lastpage

944

Abstract

GR712RC is a dual core 32-bit fault-tolerant SPARC™V8/LEON3-FT processor that has been developed and manufactured by Ramon Chip Ltd and AeroflexGaisler AB and characterized for radiation effects. It is designed with AeroflexGaisler´s intellectual property and implemented with Ramon Chip´s RadSafe™ radiation-hard-by-design library in a commercial 0.18μm shallow trench isolation CMOS process. Radiation test results for total ionizing dose, single event latch-up and single event upset data with correction/data-restore methodologies are reported, demonstrating its suitability for operating in a space environment.

Keywords

CMOS digital integrated circuits; fault tolerance; flip-flops; integrated circuit design; microprocessor chips; radiation hardening (electronics); AeroflexGaisler AB; AeroflexGaisler´s intellectual property; GR712RC dual core fault-tolerant SPARCV8-LEON3-FT processor; Ramon Chip Ltd manufacturing; Ramon Chip´s RadSafe radiation-hard-by-design library; correction-data-restore methodology; radiation effect characterization; radiation testing; shallow trench isolation CMOS process; single event latch-up; single event upset data; size 0.18 mum; total ionizing dose; word length 32 bit; Clocks; Radiation effects; Random access memory; Registers; Single event upset; Software; Testing; Error correction; Processor; Single Event Upsets; Total Ionizing Dose;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131334

Filename

6131334