Title :
SEE test results on a commercially designed and manufactured NOR FLASH
Author :
Jordan, A. ; Farris, T. ; Hafer, C. ; Thun, M. Von ; Benedetto, J.
Author_Institution :
Aeroflex Colorado Springs, Centennial, CO, USA
Abstract :
The SEE performance will be presented on a commercial designed/manufactured 64Mb NOR FLASH. The product is SEL immune and no upsets occurred at a LET = 100 either unbiased or with a static bias.
Keywords :
NOR circuits; flash memories; logic testing; radiation effects; LET; SEE performance; SEE test results; SEL immunity; commercial designed-manufactured NOR FLASH; linear energy transfer; memory size 64 MByte; single-event effects; single-event latchup; Electronic mail; Single event upset; Springs; Testing; Tin; Xenon; NOR FLASH memory; Single Event Effects; heavy ions;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131337
