DocumentCode
3032555
Title
Tritium-powered betavoltaic cells based on amorphous silicon
Author
Deus, Steffen
Author_Institution
TRACE Photonics Inc., Albuquerque, NM, USA
fYear
2000
fDate
2000
Firstpage
1246
Lastpage
1249
Abstract
Betavoltaic cells based on hydrogenated amorphous silicon nip drift junctions with ultrathin (5 nm) metal contact layers were developed for tritium-powered batteries. A large variety of amorphous silicon cells has been exposed to a tritium gas atmosphere for 46 days, and their performance has been studied in several time intervals. Initially, a short circuit current density of 637 nA/cm2, an open-circuit voltage of 457 mV, and an output power per unit area to a matched load of 136 nW/cm2 have been achieved with a 450 nm thick amorphous silicon nip drift junction. Rather large degradation of junction performance has been observed due to diffusion of a significant amount of tritium into the amorphous silicon film. Similar results have been obtained with an np AlGaAs junction, which yielded initially a short circuit current density of 937 nA/cm2, an open-circuit voltage of 467 mV, and an output power per unit area to a matched load of 259 nW/cm2. An indirect conversion battery based on tritium, a cathodoluminescent phosphor, and amorphous silicon, has also been constructed for comparison
Keywords
amorphous semiconductors; cathodoluminescence; current density; elemental semiconductors; hydrogen; p-n junctions; phosphors; photovoltaic cells; radioisotopes; short-circuit currents; tritium; 450 nm; 457 mV; 46 d; 467 mV; 5 nm; AlGaAs; Si:H; T; a-Si:H betavoltaic cells; amorphous silicon; amorphous silicon cells; cathodoluminescent phosphor; diffusion; hydrogenated amorphous silicon nip drift junctions; indirect conversion battery; junction performance degradation; matched load; np AlGaAs junction; open-circuit voltage; output power per unit area; radioisotope batteries; short circuit current density; tritium gas atmosphere; tritium-powered batteries; tritium-powered betavoltaic cells; ultrathin metal contact layers; Amorphous silicon; Annealing; Batteries; Degradation; Power generation; Radioactive materials; Semiconductor thin films; Short circuit currents; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.916115
Filename
916115
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