DocumentCode
3032653
Title
The influence of the electrical conditions on total dose behavior of the analog switches
Author
Boychenko, Dmitry V. ; Kessarinskiy, Leonid N. ; Pechenkina, Darya V.
Author_Institution
Specialized Electron. Syst. (SPELS), Moscow, Russia
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
822
Lastpage
824
Abstract
The influence of the electrical conditions on analog switches total dose behavior is investigated. The major difference in analog switches radiation hardness due to irradiation and measurement conditions is confirmed.
Keywords
analogue circuits; radiation hardening (electronics); switches; analog switches; electrical conditions; irradiation condition; measurement condition; radiation hardness; total-dose behavior; CMOS integrated circuits; Current measurement; Degradation; Leakage current; Multiplexing; Radiation effects; Switches; Dose rate; Integrated circuits; Radiation hardness; Total dose;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131340
Filename
6131340
Link To Document