SET and SEU simulation toolkit for LabVIEW

Author

Bartra, Walter Calienes ; Reis, Ricardo

Author_Institution

Inst. of Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

829

Lastpage

836

Abstract

Nowadays, the fault simulation is an important step in any IC design. Predicting the behavioral faults of any process step is essential to ensure that the design is well implemented. During the simulation various problems can be detected and corrected. It is presented a tool to simulate the effects that occur when a source of fault is inserted in a digital circuit, especially SEU faults. To model a fault, it was also developed a TMR method capable of verifying the existence of a fault and to not let it spread through the whole circuit. It was also developed a Voltage Controlled Oscillator (VCO) to view fault effects in analog circuits. LabVIEW tool is used to create a set of virtual instruments to simulate SEUs. It is efficient in modeling the Characteristics of SETs. It is possible with this toolkit to replicate the effects of SEUs and SETs described in the literature.

Keywords

integrated circuit design; tunnelling magnetoresistance; virtual instrumentation; voltage-controlled oscillators; IC design; LabVIEW tool; SET simulation toolkit; SEU simulation toolkit; TMR method; VCO; analog circuits; digital circuit; virtual instruments; voltage controlled oscillator; Adaptation models; Circuit faults; Integrated circuit modeling; Logic gates; Registers; Threshold voltage; Transistors; Fault; LabVIEW; Microelectronics; SET; SEU; Simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131342

Filename

6131342