Title :
The effects of electron irradiation on triple-junction Ga0.5 In0.5P/GaAs/Ge solar cells
Author :
Cotal, H.L. ; King, R.R. ; Haddad, M. ; Ermer, J.H. ; Karam, N.H. ; Krut, D.D. ; Joslin, D.E. ; Takahashi, M. ; Cavicchi, B.T.
Author_Institution :
Spectrolab Inc., Sylmar, CA, USA
Abstract :
Ga0.5In0.5P/GaAs/Ge solar cells have been fabricated at Spectrolab under the Multijunction Solar Cell Manufacturing Technology (Mantech) program, sponsored by the US Air Force and NASA. The cells were irradiated with increasing 1 MeV electron fluences, and the degradation of their PV parameters was characterized using light I-V and external QE. Analysis of the PV parameters of the GaInP top subcell showed little degradation, and was not a limitation for triple junction (3J) cell performance. Furthermore, the radiation degradation of the Ge subcell PV parameters was almost negligible. The GaAs subcell Isc, however, did limit the device performance as is traditionally documented. The final-to-initial maximum power ratio (P/P0) of 3J cells was near 0.833 at a fluence of 1×10 15 e-/cm2, and matches Spectrolab´s presently established value of 0.83 for standard production of space-qualified dual-junction cells
Keywords :
III-V semiconductors; electron beam effects; elemental semiconductors; gallium arsenide; gallium compounds; germanium; indium compounds; p-n heterojunctions; short-circuit currents; solar cells; 1 MeV; Ga0.5In0.5P-GaAs-Ge; GaAs subcell short circuit current; GaInP top subcell; Ge; Ge subcell PV parameters; Mantech program; Multijunction Solar Cell Manufacturing Technology program; NASA; PV parameters; PV parameters degradation; Spectrolab; US Air Force; device performance limiting; electron fluence; electron irradiation effects; external QE; final-to-initial maximum power ratio; light I-V; radiation degradation; triple-junction Ga0.5In0.5P/GaAs/Ge solar cells; Degradation; Electrical resistance measurement; Electrons; Epitaxial growth; Gallium arsenide; Manufacturing; Optical filters; Photovoltaic cells; Space technology; Substrates;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916133