• DocumentCode
    3032854
  • Title

    The effects of electron irradiation on triple-junction Ga0.5 In0.5P/GaAs/Ge solar cells

  • Author

    Cotal, H.L. ; King, R.R. ; Haddad, M. ; Ermer, J.H. ; Karam, N.H. ; Krut, D.D. ; Joslin, D.E. ; Takahashi, M. ; Cavicchi, B.T.

  • Author_Institution
    Spectrolab Inc., Sylmar, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1316
  • Lastpage
    1319
  • Abstract
    Ga0.5In0.5P/GaAs/Ge solar cells have been fabricated at Spectrolab under the Multijunction Solar Cell Manufacturing Technology (Mantech) program, sponsored by the US Air Force and NASA. The cells were irradiated with increasing 1 MeV electron fluences, and the degradation of their PV parameters was characterized using light I-V and external QE. Analysis of the PV parameters of the GaInP top subcell showed little degradation, and was not a limitation for triple junction (3J) cell performance. Furthermore, the radiation degradation of the Ge subcell PV parameters was almost negligible. The GaAs subcell Isc, however, did limit the device performance as is traditionally documented. The final-to-initial maximum power ratio (P/P0) of 3J cells was near 0.833 at a fluence of 1×10 15 e-/cm2, and matches Spectrolab´s presently established value of 0.83 for standard production of space-qualified dual-junction cells
  • Keywords
    III-V semiconductors; electron beam effects; elemental semiconductors; gallium arsenide; gallium compounds; germanium; indium compounds; p-n heterojunctions; short-circuit currents; solar cells; 1 MeV; Ga0.5In0.5P-GaAs-Ge; GaAs subcell short circuit current; GaInP top subcell; Ge; Ge subcell PV parameters; Mantech program; Multijunction Solar Cell Manufacturing Technology program; NASA; PV parameters; PV parameters degradation; Spectrolab; US Air Force; device performance limiting; electron fluence; electron irradiation effects; external QE; final-to-initial maximum power ratio; light I-V; radiation degradation; triple-junction Ga0.5In0.5P/GaAs/Ge solar cells; Degradation; Electrical resistance measurement; Electrons; Epitaxial growth; Gallium arsenide; Manufacturing; Optical filters; Photovoltaic cells; Space technology; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916133
  • Filename
    916133