Evaluating the use of a platform for combined tests of total ionizing dose radiation and Electromagnetic immunity

Author

Benfica, J. ; Poehls, L. M Bolzani ; Vargas, F. ; Lipovetzky, J. ; Lutenberg, A. ; García, S.E. ; Gatti, E. ; Hernandez, F. ; Calazans, N.L.V.

Author_Institution

Catholic Univ. of Rio Grande do Sul (PUCRS), Porto Alegre, Brazil

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

473

Lastpage

478

Abstract

Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.

Keywords

electromagnetic interference; embedded systems; field programmable gate arrays; integrated circuit reliability; logic testing; radiation hardening (electronics); EM immunity; EM interference; EMI; FPGA; TID radiation; combined tests; delay probability; electromagnetic immunity; embedded system reliabilty; embedded systems; fault occurrence probability; total-ionizing dose radiation; Delay; Electromagnetic interference; Field programmable gate arrays; IEC standards; Noise; Power supplies; Voltage fluctuations; Electromagnetic Immunity; Embedded Systems; Total Ionizing Dose Radiation;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131354

Filename

6131354