Title :
Comparison Of Logic Circuits Simulated In The FET-SEED Technology
Author :
Novotny, K.A. ; Lentine, Anthony L. ; Chirovsky, L.M.F. ; Woodward, T.K.
Author_Institution :
AT&T Bell Laboratories
Keywords :
Circuit noise; Circuit simulation; Delay; FETs; Integrated circuit technology; Integrated optics; Logic circuits; Optical reflection; Pulse inverters; Space technology;
Conference_Titel :
Integrated Optoelectronics, 1994., Proceedings of IEE/LEOS Summer Topical Meetings:
Print_ISBN :
0-7803-1752-1
DOI :
10.1109/LEOSST.1994.700454