• DocumentCode
    3033061
  • Title

    Mars Array Technology Experiment (MATE) [space power solar cell performance]

  • Author

    Scheiman, David A. ; Jenkins, Phillip ; Landis, Geoffrey A. ; Baraona, Cosmo ; Wilt, Dave ; Krasowski, Michael ; Greer, Lawrence ; Lekki, John ; Spina, Daniel

  • Author_Institution
    Ohio Aerospace Inst., Brookpark, OH, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1362
  • Lastpage
    1365
  • Abstract
    Airborne and settled dust on the surface of Mars alters the sunlight and fluctuates from day to day, it affects both the intensity and spectral content. Future missions to Mars are considering solar power and therefore solar cell technologies must be evaluated to find the optimum. The MATE flight experiment was designed for this purpose as part of the Mars In-Situ Propellant Production Precursor (MIP) package destined to fly on the now defunct ´01 Lander. MATE will measure the performance of several solar cell technologies and characterize the Martian environment in terms of solar power. This will be done by measuring full IV curves on solar cells, direct and global insolation, temperature, and spectral content. MATE is qualified for a site location near the equator for 100 to 300 days. The intent of this paper is to provide a brief overview of this experiment
  • Keywords
    Mars; aerospace testing; dust; semiconductor device measurement; semiconductor device testing; solar cell arrays; space vehicle power plants; 100 to 300 day; I-V curves; MATE; Mars Array Technology Experiment; Mars In-Situ Propellant Production Precursor (MIP) package; Martian environment; direct insolation; dust; global insolation; solar cell technologies; solar power; space power solar cell performance testing; spectral content; sunlight; temperature; Mars; NASA; Packaging; Photovoltaic cells; Production; Propulsion; Radiometers; Solar energy; Space technology; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916145
  • Filename
    916145