DocumentCode
3033080
Title
How to sample results of concurrent error detection schemes in transient fault scenarios?
Author
Bastos, Rodrigo P. ; Natale, Giorgio Di ; Flottes, Marie-Lise ; Rouzeyre, Bruno
Author_Institution
LIRMM, Univ. Montpellier II, Montpellier, France
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
635
Lastpage
642
Abstract
This work analyses and classifies strategies for sampling results of concurrent error detection (CED) schemes in transient fault scenarios. It shows that dealing with results - indicating the occurrence of transient faults in circuits - can require additional mechanisms to make the error indication useful for system´s recovery procedures. The paper highlights that not all error indications are noticed by certain strategies of varied costs, and therefore their efficiencies in sampling results as well as the performance, power, and area overheads added to the CED schemes must be considered. The work then finishes presenting a qualitative comparison between existing strategies in function of design goals.
Keywords
combinational circuits; fault diagnosis; flip-flops; integrated circuit reliability; radiation hardening (electronics); transient analysis; CED schemes; area overhead; circuits; concurrent error detection schemes; performance overhead; power overhead; sampling results; system recovery procedures; transient fault scenarios; Circuit faults; Clocks; Latches; Redundancy; Registers; Timing; Transient analysis; Circuit and system radiation hardening and mitigation; concurrent error detection schemes; fault attacks; soft errors; transient faults;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131361
Filename
6131361
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