• DocumentCode
    3033080
  • Title

    How to sample results of concurrent error detection schemes in transient fault scenarios?

  • Author

    Bastos, Rodrigo P. ; Natale, Giorgio Di ; Flottes, Marie-Lise ; Rouzeyre, Bruno

  • Author_Institution
    LIRMM, Univ. Montpellier II, Montpellier, France
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    635
  • Lastpage
    642
  • Abstract
    This work analyses and classifies strategies for sampling results of concurrent error detection (CED) schemes in transient fault scenarios. It shows that dealing with results - indicating the occurrence of transient faults in circuits - can require additional mechanisms to make the error indication useful for system´s recovery procedures. The paper highlights that not all error indications are noticed by certain strategies of varied costs, and therefore their efficiencies in sampling results as well as the performance, power, and area overheads added to the CED schemes must be considered. The work then finishes presenting a qualitative comparison between existing strategies in function of design goals.
  • Keywords
    combinational circuits; fault diagnosis; flip-flops; integrated circuit reliability; radiation hardening (electronics); transient analysis; CED schemes; area overhead; circuits; concurrent error detection schemes; performance overhead; power overhead; sampling results; system recovery procedures; transient fault scenarios; Circuit faults; Clocks; Latches; Redundancy; Registers; Timing; Transient analysis; Circuit and system radiation hardening and mitigation; concurrent error detection schemes; fault attacks; soft errors; transient faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131361
  • Filename
    6131361