Title :
Non-intrusive reconfigurable HW/SW fault tolerance approach to detect transient faults in microprocessor systems
Author :
Azambuja, José Rodrigo ; Pagliarini, Samuel ; Altieri, Mauricio ; Kastensmidt, Fernanda Lima ; Hübner, Michael ; Becker, Jürgen ; Foucard, Gilles ; Velazco, Raoul
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and software techniques to detect transient faults in microprocessors. Such faults have a major influence in microprocessor systems, affecting both data and control flow. In order to protect the system, an application-oriented hardware module is automatically generated and reconfigured on the system during runtime. When combined with fault tolerance techniques based on software, this solution offers full system protection against transient faults. A fault injection campaign is performed using a MIPS microprocessor executing a set of applications. HW/SW implementation in a reprogrammable platform shows minimal memory area and execution time overhead. Fault injection results show the efficiency of this method on detecting 100% of faults.
Keywords :
fault tolerance; microprocessor chips; radiation hardening (electronics); MIPS microprocessor systems; application-oriented hardware module; control flow; data flow; hardware techniques; nonintrusive hybrid fault detection approach; nonintrusive reconfigurable HW-SW fault tolerance approach; software techniques; transient fault detection; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Hardware; Microprocessors; Registers; Software; Fault tolerance; Microprocessors; Reconfigurable; Single Event Effects;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131362