• DocumentCode
    3033613
  • Title

    ISO 14000 introduction in the photovoltaic industry

  • Author

    Rosenblum, M.D. ; Brown, R.L. ; Gonsiorawski, R. ; Kalejs, J.P.

  • Author_Institution
    ASE Americas Inc., Billerica, MA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1476
  • Lastpage
    1478
  • Abstract
    ASE Americas has initiated a program to become certified under the ISO 14001 environmental management system. Background information is provided about the ISO 14000 series of standards, along with benefits resulting from certification. Details specific to the efforts being undertaken at our facility to become ISO 14001 certified are given. A gap audit has been conducted to assess our current state of readiness in advance of the registration process: highlights of the findings are presented. We then highlight several processes which have been developed and implemented at ASE to abate the environmental impact of PV manufacturing and address product life cycle concerns. Foremost among these are pioneering work on the use of lead-free solder paste for cell interconnect, and development of new technology to reduce the volume of acids used in manufacturing in the areas of wafer etching/cleaning and phosphorus glass etching
  • Keywords
    ISO standards; certification; environmental factors; etching; management; solar cells; soldering; surface cleaning; ASE Americas; ISO 14000; ISO 14001 environmental management system; PV manufacturing; cell interconnect; environmental impact abatement; gap audit; lead-free solder paste; phosphorus glass etching; photovoltaic industry; product life cycle; solar cell manufacture; wafer cleaning; wafer etching; Certification; Environmental management; Environmentally friendly manufacturing techniques; Etching; Glass manufacturing; ISO standards; Lead; Manufacturing processes; Photovoltaic systems; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916172
  • Filename
    916172