Title :
Reliability and performance testing of photovoltaic modules
Author :
Wohlgemuth, John H. ; Conway, Mark ; Meakin, David H.
Author_Institution :
BP Solar, Frederick, MD, USA
Abstract :
In recent years there has been a paradigm shift in photovoltaic module testing from reliability to qualification testing. This has raised several questions as to whether or not reliability testing is still required. This paper discusses why reliability testing is still a necessary and integral part of product development and deployment. It also discusses new test procedures that have been developed or are currently under development to improve and enhance reliability testing
Keywords :
product development; semiconductor device measurement; semiconductor device reliability; semiconductor device testing; solar cell arrays; performance testing; photovoltaic modules; product deployment; product development; qualification testing; reliability testing; test procedures; Failure analysis; Life estimation; Manufacturing industries; Manufacturing processes; Photovoltaic systems; Product development; Qualifications; Solar power generation; Testing; Warranties;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916174
