• DocumentCode
    3033656
  • Title

    Reliability and performance testing of photovoltaic modules

  • Author

    Wohlgemuth, John H. ; Conway, Mark ; Meakin, David H.

  • Author_Institution
    BP Solar, Frederick, MD, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1483
  • Lastpage
    1486
  • Abstract
    In recent years there has been a paradigm shift in photovoltaic module testing from reliability to qualification testing. This has raised several questions as to whether or not reliability testing is still required. This paper discusses why reliability testing is still a necessary and integral part of product development and deployment. It also discusses new test procedures that have been developed or are currently under development to improve and enhance reliability testing
  • Keywords
    product development; semiconductor device measurement; semiconductor device reliability; semiconductor device testing; solar cell arrays; performance testing; photovoltaic modules; product deployment; product development; qualification testing; reliability testing; test procedures; Failure analysis; Life estimation; Manufacturing industries; Manufacturing processes; Photovoltaic systems; Product development; Qualifications; Solar power generation; Testing; Warranties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916174
  • Filename
    916174