Title :
Applications for infrared imaging equipment in photovoltaic cell, module, and system testing
Author :
King, D.L. ; Kratochvil, J.A. ; Quintana, M.A. ; McMahon, T.J.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Anomalous temperature distributions are often an indication of atypical behavior in a device under investigation. Portable infrared (IR) imaging systems (cameras) now provide a convenient method for measuring both absolute and relative temperature distributions on small and large components with a high degree of temperature and spatial resolution. This diagnostic tool can be applied during the development, production, monitoring, and repair of photovoltaic cells, modules, and systems. Planar objects with nearly uniform material composition are ideally suited for analysis using IR imaging. This paper illustrates investigations of localized shunting in cells, resistive solder bonds in field-aged modules, module bypass diode functionality, reverse-bias (hot spot) heating in modules, temperature distributions in flat-plate and concentrator modules, batteries during charging, and electronic component temperature in power processing equipment
Keywords :
infrared imaging; semiconductor device measurement; semiconductor device testing; solar cell arrays; solar cells; temperature distribution; thermal analysis; anomalous temperature distributions; concentrator modules; diagnostic tool; field-aged modules; flat-plate modules; infrared imaging equipment; module bypass diode functionality; photovoltaic cells; photovoltaic modules; photovoltaic systems; resistive solder bonds; Cameras; Composite materials; High-resolution imaging; Infrared imaging; Monitoring; Optical imaging; Photovoltaic cells; Production systems; Spatial resolution; Temperature distribution;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916175