DocumentCode :
3033849
Title :
Electrical performances and radiation qualification tests results of a highly integrated and Space qualified Point of Load Converter
Author :
Vassal, Marie-Cécile ; Dubus, Patrick ; Fiant, Nicolas
Author_Institution :
3D Plus, Buc, France
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
285
Lastpage :
290
Abstract :
3D Plus developed a highly miniaturized and Space qualified Point of Load (POL) Converter to power modern fast digital electronics such as ASICs, FPGAs and Memory devices that require low voltages with a high precision regulation and excellent dynamic performances under large load transients. The POL Converter is hardened by design thanks to specific radiation effects mitigation techniques and space design de-rating rules. It is built with a space qualified 3D System-In-Package (SIP) technology and embeds 113 add on parts spread over 3 stacked layers. Thanks to the unique 3D Plus technology, the device size is limited to 25 x 26.5 x 10 mm. This paper discuss the converter topology trade-offs and highlight some final design solutions implemented to achieve the best compromise between efficiency, dynamic performance, protection/flexibility and radiation hardening level. The product electrical test results and the radiation hardening strategy, the Total Ionizing Dose (TID), Single Event Latch-up (SEL) and Single Event Effect (SEE) test results are also presented.
Keywords :
integrated circuit testing; power convertors; radiation hardening (electronics); system-in-package; 3D Plus technology; 3D SIP technology; 3D system-in-package technology; ASIC; FPGA; POL; SEE testing; SEL testing; TID testing; converter topology; electrical performance testing; highly integrated space qualified point of load converter; load transient; memory device; power modern fast digital electronic; radiation effect mitigation technique; radiation hardening level; radiation qualification testing; single event effect testing; single event latch-up testing; space design derating rule; total ionizing dose testing; Integrated circuits; Logic gates; MOSFETs; Performance evaluation; Radiation effects; Radiation hardening; Transient analysis; Point of Load Converter; Radiation Hardening test strategy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131398
Filename :
6131398
Link To Document :
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