DocumentCode :
303386
Title :
Multiresolution wavelet analysis based feature extraction for neural network classification
Author :
Chen, C.H. ; Lee, G.G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Dartmouth, MA, USA
Volume :
3
fYear :
1996
fDate :
3-6 Jun 1996
Firstpage :
1416
Abstract :
In this paper we introduce a novel feature extraction scheme as a preprocessor for artificial neural network (ANN) classification. We have shown that the feature extraction scheme implemented via a non-stationary Gaussian Markov random field based on a multiresolution wavelet framework can provide effective features for both the ANN and fuzzy c-means (FCM) classification. In our experiment with natural textures and real world digital mammography, each region of the tested images is assumed to be a different class. A label field with each region or class being represented by the same gray-scale was then found by the backpropagation neural network and FCM clustering algorithm using the extracted discriminatory features. Further enhancement of the segmented result was achieved via Bayesian learning. The formulation of this maximum a posteriori (MAP) estimator was based on the Gibbs prior assumption which is especially appropriate for modeling real world mammograms. Although being estimated by constrained optimization, the MAP estimator can also be found from neural networks such as the Boltzmann and the mean-field-theory machines
Keywords :
Bayes methods; backpropagation; diagnostic radiography; feature extraction; feedforward neural nets; image classification; optimisation; wavelet transforms; Bayesian learning; Gaussian Markov random field; Gibbs prior assumption; backpropagation neural network; digital mammography; feature extraction; fuzzy c-means clustering; maximum a posteriori estimator; multiresolution wavelet analysis; neural network classification; optimization; Artificial neural networks; Backpropagation; Clustering algorithms; Feature extraction; Gray-scale; Mammography; Markov random fields; Neural networks; Testing; Wavelet analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1996., IEEE International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3210-5
Type :
conf
DOI :
10.1109/ICNN.1996.549107
Filename :
549107
Link To Document :
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