• DocumentCode
    3034032
  • Title

    Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier

  • Author

    Perez, S. ; Dusseau, L. ; Velo, Y. Gonzalez ; Vaillé, J-R ; Boch, J. ; Saigné, F. ; Bezerra, F. ; Ecoffet, R.

  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    270
  • Lastpage
    273
  • Abstract
    The impact of Total Ionizing Dose on a typical current feedback amplifier, the AD844 irradiated with 60Co source is investigated. The positive input current and the output voltage present an erratic behavior, that may differ from sample to sample. Circuit analysis is conducted in order to determine the degradation mechanisms.
  • Keywords
    feedback amplifiers; radiation hardening (electronics); AD844; TID; circuit analysis; circuit effects; current feedback amplifier; erratic degradation; total ionizing dose; Degradation; Feedback amplifier; Impedance; Mirrors; Performance evaluation; Radiation effects; Transistors; 60Co; Current feedback amplifier; Total Ionizing Dose; bipolar ICs; current conveyor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131407
  • Filename
    6131407
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3034032