DocumentCode :
3034285
Title :
Comparison between root-impulse-energy and vector network analyzer methods for measuring loss on printed circuit boards
Author :
Harper, Matthew R. ; Ridler, Nick M. ; Salter, Martin J.
fYear :
2008
fDate :
9-12 Dec. 2008
Firstpage :
20
Lastpage :
25
Abstract :
This paper presents a comparison of two methods for measuring the electrical loss for transmission lines on printed circuit boards (PCBs). The two methods are (i) the root impulse energy (RIE) method which is a time-domain reflectometry (TDR)-based method using a pulse generator and a sampling oscilloscope and (ii) a method based on the use of a vector network analyzer (VNA) to measure the S-parameters of the line in the frequency domain. Results and uncertainties obtained by the two methods for connectorized microstrip lines on flexible FR4 are presented and compared.
Keywords :
S-parameters; microstrip lines; network analysers; printed circuits; time-domain reflectometry; transmission lines; S-parameters; electrical loss; microstrip lines; printed circuit boards; pulse generator; root-impulse-energy method; sampling oscilloscope; time-domain reflectometry-based method; transmission lines; vector network analyzer method; Distributed parameter circuits; Electric variables measurement; Loss measurement; Printed circuits; Propagation losses; Pulse generation; Reflectometry; Sampling methods; Time domain analysis; Transmission line measurements; Printed circuit testing; Scattering parameters; Time domain reflectometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-2300-2
Electronic_ISBN :
978-1-4244-2300-2
Type :
conf
DOI :
10.1109/ARFTG.2008.4804275
Filename :
4804275
Link To Document :
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