Title :
Microprocessor soft error rate prediction based on cache memory analysis
Author :
Houssany, S. ; Guibbaud, N. ; Bougerol, A. ; Leveugle, R. ; Miller, F. ; Buard, N.
Author_Institution :
Innovation Works, EADS France the Eur. Aeronaut. Defense & Space Co., Suresnes, France
Abstract :
Static raw soft-error rates (SER) of COTS microprocessors are classically obtained with particle accelerators, but they are far larger than real application failure rates that depend on the dynamic application behavior and on the cache protection mechanisms. In this paper, we propose a new methodology to evaluate the real cache sensitivity for a given application, and to calculate a more accurate failure rate. This methodology is based on the monitoring of cache accesses, and requires a microprocessor simulator. It is applied in this paper to the LEON3 soft-core with several benchmarks. Results are validated by fault injections on one implementation of the processor running the same programs: the proposed tool predicted all errors with only a small over-estimation.
Keywords :
cache storage; failure analysis; microprocessor chips; particle accelerators; radiation hardening (electronics); COTS microprocessors; LEON3 soft-core; SER; benchmarks; cache access monitoring; cache memory analysis; cache protection mechanisms; cache sensitivity; dynamic application behavior; failure rates; fault injections; microprocessor simulator; microprocessor soft-error rate prediction; particle accelerators; static-raw soft-error rates; Benchmark testing; Cache memory; Emulation; Error correction codes; Microprocessors; Sensitivity; Software; Cache memories; Microprocessors; Simulator; Soft Error Rate;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131417