• DocumentCode
    3034338
  • Title

    Characterization of SEFI events on the EDODRAM used in large space solid state memory

  • Author

    Mazurek, M. ; Grandjean, M. ; Lochon, F. ; Guerre, FX ; Standarovski, D. ; Dangla, D. ; Damery, JC

  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    426
  • Lastpage
    429
  • Abstract
    This paper details the results of a heavy ion test carried-out on a 64Mb EDODRAM memory from Micron. During this study, a correlation between current steps and SEFI events will be established. Finally, a software strategy for replacing an obsolete device without a strong impact of the design will be proposed.
  • Keywords
    DRAM chips; Micron EDODRAM memory; SEFI events; large space solid state memory; software strategy; Graphical user interfaces; Ion sources; Monitoring; Performance evaluation; Software; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131419
  • Filename
    6131419
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3034338