Design aids and test results for laser-programmable logic arrays

Author

Allen, David L. ; Goldenberg, Richard

Author_Institution

MIT Lincoln Lab., Lexington, MA, USA

fYear

1990

fDate

17-19 Sep 1990

Firstpage

386

Lastpage

390

Abstract

The time required to customized a logic array circuit can be reduced to minutes by the use of laser programming without the access and resistance limitations of electrically programmable devices. A restructable logic array (RLA) that can be completely tested before packaging and can be fabricated in a standard CMOS process has been developed. Its key element is a connective laser link device. Circuits of up to 1200 gate equivalents have been restructured, and a base array of 4000 raw gate equivalents is in fabrication. A chip architecture, associated testing, and electrical design features, as well as their use in custom circuits are described

Keywords

CMOS integrated circuits; circuit CAD; logic arrays; 1200 gate equivalents; 4000 raw gate equivalents; chip architecture; connective laser link device; custom circuits; electrical design features; laser-programmable logic arrays; logic array circuit; restructable logic array; standard CMOS process; CMOS logic circuits; Circuit testing; Logic arrays; Logic design; Logic devices; Logic programming; Logic testing; Optical arrays; Optical design; Programmable logic arrays;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1990. ICCD '90. Proceedings, 1990 IEEE International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-2079-X

Type

conf

DOI

10.1109/ICCD.1990.130248

Filename

130248