• DocumentCode
    3034399
  • Title

    TPA laser source for SEE test at UCM

  • Author

    Lopez-Calle, I. ; Franco, F.J. ; Agapito, J.A. ; Izquierdo, J.G. ; Reviriego, P. ; Maestro, A.

  • Author_Institution
    Dept. de Fis. Aplic. III, Univ. Complutense de Madrid (UCM), Madrid, Spain
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    454
  • Lastpage
    457
  • Abstract
    A new LASER source for SEE test at the University Complutense of Madrid is presented to the scientific community. Due to the limitations of the SPA technique, this new facility use the TPA technique since it allows, normally, the carrier injection at any controlled depth in the material using backside irradiations.
  • Keywords
    radiation hardening (electronics); SEE test; SPA technique; TPA laser source; TPA technique; UCM; University Complutense of Madrid; backside irradiations; carrier injection; scientific community; Absorption; Laser beams; Laser modes; Optical attenuators; Photonics; Radiation effects; Ultrafast optics; Heavy Ion; Laser irradiation; SEE test; TPA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131421
  • Filename
    6131421
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3034399