Title :
TPA laser source for SEE test at UCM
Author :
Lopez-Calle, I. ; Franco, F.J. ; Agapito, J.A. ; Izquierdo, J.G. ; Reviriego, P. ; Maestro, A.
Author_Institution :
Dept. de Fis. Aplic. III, Univ. Complutense de Madrid (UCM), Madrid, Spain
Abstract :
A new LASER source for SEE test at the University Complutense of Madrid is presented to the scientific community. Due to the limitations of the SPA technique, this new facility use the TPA technique since it allows, normally, the carrier injection at any controlled depth in the material using backside irradiations.
Keywords :
radiation hardening (electronics); SEE test; SPA technique; TPA laser source; TPA technique; UCM; University Complutense of Madrid; backside irradiations; carrier injection; scientific community; Absorption; Laser beams; Laser modes; Optical attenuators; Photonics; Radiation effects; Ultrafast optics; Heavy Ion; Laser irradiation; SEE test; TPA;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131421
