Title :
On the definition of real conditions for a fault injection experiment on embedded systems
Author :
Restrepo-Calle, Felipe ; Cuenca-Asensi, Sergio ; Aguirre, Miguel A. ; Palomo, Francisco R. ; Guzmán-Miranda, Hipólito ; Martínez-Álvarez, Antonio
Author_Institution :
Comput. Technol. Dept., Univ. of Alicante, Alicante, Spain
Abstract :
This paper remarks the importance of defining real conditions for the radiation effects evaluation on embedded systems using a fault injection system. The influence of fault latency on the experiment results is illustrated by means of a case study.
Keywords :
digital circuits; embedded systems; radiation hardening (electronics); digital circuits; embedded system; fault injection experiment; fault latency influence; radiation effect evaluation; Circuit faults; Clocks; Digital filters; Embedded systems; Field programmable gate arrays; Microprocessors; Registers; Radiation effects; embedded systems; fault latency;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131425
