• DocumentCode
    3034505
  • Title

    Prediction of product layer cycle time using data mining

  • Author

    Hassoun, Michael

  • Author_Institution
    Ind. Eng. & Manage., Ariel Univ., Ariel, Israel
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    3905
  • Lastpage
    3911
  • Abstract
    Based on a simulated non volatile memory (NVM) fab, we show that forecasting the steady state cycle time of process segments is possible using certain segment characteristics. We also show that the cycle time predictability is highly dependent on the choice of the segmentation, with the more efficient segmentation corresponding to the product layers.
  • Keywords
    data mining; product development; production engineering computing; semiconductor industry; NVM; cycle time predictability; data mining; nonvolatile memory; process segments; product layer cycle time prediction; product layers; segment characteristics; segmentation choice; Availability; Computational modeling; Data mining; Data models; Predictive models; Semiconductor device modeling; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), 2013 Winter
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4799-2077-8
  • Type

    conf

  • DOI
    10.1109/WSC.2013.6721749
  • Filename
    6721749
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3034505