The influence of calibration substrate boundary conditions on CPW characteristics and calibration accuracy at mm-wave frequencies

Author

Rumiantsev, Andrej ; Doerner, Ralf ; Godshalk, Edward M.

Author_Institution

SUSS MicroTec Test Syst. GmbH, Sacka

fYear

2008

fDate

9-12 Dec. 2008

Firstpage

168

Lastpage

173

Abstract

This paper presents new experimental investigations of the influence of calibration substrate boundary conditions on CPW transmission line characteristics and calibration accuracy at millimeter wavelengths. A new configuration that decreases insertion loss of CPW transmission lines and improves calibration accuracy is suggested.

Keywords

S-parameters; calibration; coplanar transmission lines; coplanar waveguides; error correction; millimetre wave devices; substrate integrated waveguides; CPW transmission line characteristics; calibration substrate boundary condition; coplanar waveguide; error correction; millimetre wave frequency; scattering parameters measurement; Boundary conditions; Calibration; Coplanar waveguides; Couplings; Frequency; Surface waves; Tellurium; Transmission line measurements; Transmission line theory; Wavelength measurement; calibration; calibration comparison; error correction; scattering parameters measurement; surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Symposium, 2008 72nd ARFTG

Conference_Location

Portland, OR

Print_ISBN

978-1-4244-2300-2

Electronic_ISBN

978-1-4244-2300-2

Type

conf

DOI

10.1109/ARFTG.2008.4804293

Filename

4804293