Title :
Precise measurement method for high frequency dielectrics
Author :
Wakino, K. ; Tamura, H. ; Tanaka, H.
Author_Institution :
Murata Manufacturing Co. Ltd., Kyoto, Japan
Abstract :
The precise measurement methods for dielectric materials are described. Improvements both in accuracy and speed are described for the technique of measuring the microwave dielectric properties of low-loss materials by dielectric rod resonators placed between two parallel conductor plates and in a conductor cavity. For the microwave dielectric substrate measurement, a two-dielectric-resonator method was developed. Harmonic distortion measurement using three dielectric resonators in the microwave region is described
Keywords :
dielectric measurement; accuracy; conductor cavity; dielectric rod resonators; harmonic distortion; high frequency dielectrics; low-loss materials; measurement methods; microwave dielectric properties; microwave dielectric substrate; microwave region; speed; two-dielectric-resonator method; Conducting materials; Dielectric materials; Dielectric measurements; Dielectric substrates; Distortion measurement; Frequency measurement; Harmonic distortion; Microwave measurements; Microwave theory and techniques; Velocity measurement;
Conference_Titel :
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location :
Urbana-Champaign, IL
Print_ISBN :
0-7803-0190-0
DOI :
10.1109/ISAF.1990.200186
