Data Acquisition and Virtual Instrumentation system for the study of Peltier and Seebeck effects

Author

Sandu, Florin ; Sandu, Venetia ; Nan, Stefan ; Dumitru, Adrian Iulian

Author_Institution

´´Transilvania´´ Univ. of Brasov, Brasov, Romania

fYear

2010

fDate

20-22 May 2010

Firstpage

903

Lastpage

908

Abstract

The paper presents the development of a data acquisition system dedicated to the study of Peltier and Seebeck effect and to the performance parameters of a commercial thermoelectric semiconductor element. It was used a National Instruments NI USB-6008 Data Acquisition System (connected to National Semiconductor LM35 temperature sensors) to build a Virtual Instrumentation system programmed in NI LabView. There are presented computational models and experimental data interpretations.

Keywords

Peltier effect; Seebeck effect; data acquisition; electrical engineering computing; semiconductor devices; virtual instrumentation; NI USB-6008; NI labView; National Instruments; Peltier effect; Seebeck effect; data acquisition system; thermoelectric semiconductor element; virtual instrumentation system; Circuit testing; Data acquisition; Heat pumps; Instruments; Probes; Temperature measurement; Temperature sensors; Thermal conductivity; Thermoelectricity; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Optimization of Electrical and Electronic Equipment (OPTIM), 2010 12th International Conference on

Conference_Location

Basov

ISSN

1842-0133

Print_ISBN

978-1-4244-7019-8

Type

conf

DOI

10.1109/OPTIM.2010.5510513

Filename

5510513