DocumentCode
3034792
Title
Mechanical and electrical properties of electronic ceramics under high stress condition and microstructures
Author
Tanimoto, Toshio ; Okazaki, Kiyoshi
Author_Institution
Dept. of Mater. Sci. & Ceramic Technol., Shonan Inst. of Technol., Kanagawa, Japan
fYear
1990
fDate
6-8 Jun 1990
Firstpage
40
Lastpage
43
Abstract
Mechanical properties of several kinds of electronic ceramics were investigated. Compression tests were carried out until the mechanical failure took place. Then, the ultimate breaking strengths were compared among the various electronic ceramics investigated. The changes of piezoelectric properties in the piezoelectric ceramics subjected to increasing compression load were measured. The fracture surface was observed with scanning electron microscopy. The rectangular alumina plate samples were fired at the temperature range of 1480-1660°C in the dimensions of 10-mm width, 50-mm length and 0.8-mm thickness. The static tension test was performed with a specimen geometry devised to prevent fracture at the gripping portion. Statistical analysis based on a two-parameter Weibull distribution revealed that the dispersion of tensile strength was comparatively small when using the present specimen geometry, and the samples fired at 1540°C showed a maximum tensile strength. These results are discussed from the viewpoint of the microstructure
Keywords
alumina; ceramics; compressive testing; crystal microstructure; fracture; piezoelectric materials; scanning electron microscope examination of materials; tensile strength; 1480 to 1660 degC; Al2O3; breaking strengths; compression load; compression tests; electrical properties; electronic ceramics; fracture surface; high stress condition; mechanical failure; mechanical properties; microstructures; piezoelectric ceramics; piezoelectric properties; rectangular alumina plate samples; scanning electron microscopy; static tension test; statistical analysis; tensile strength; two-parameter Weibull distribution; Ceramics; Geometry; Mechanical factors; Performance evaluation; Scanning electron microscopy; Statistical analysis; Surface cracks; Temperature distribution; Testing; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1990., IEEE 7th International Symposium on
Conference_Location
Urbana-Champaign, IL
Print_ISBN
0-7803-0190-0
Type
conf
DOI
10.1109/ISAF.1990.200196
Filename
200196
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