DocumentCode
3034838
Title
PROBA-II Technology Demonstration Module in-flight data analysis
Author
Harboe-Sørensen, R. ; Poivey, C. ; Zadeh, A. ; Keating, A. ; Fleurinck, N. ; Puimege, K. ; Guerre, F.-X. ; Lochon, F. ; Kaddour, M. ; Li, L. ; Walter, D.
Author_Institution
RHS, Voorhout, Netherlands
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
581
Lastpage
586
Abstract
A Technology Demonstration Module (TDM) to monitor radiation effects in semiconductor devices was part of the payload on-board the European Space Agency (ESA) PROBA-II satellite. PROBA-II was launched on November 2nd 2009, into an 800 km polar orbit with the TDM switched-on since February 15th 2010. The TDM primarily carries modern memory devices in order to monitor and record their Single Event Effect (SEE) behavior in respect to orbital positions. This paper presents details of in-flight data obtained between February 15th 2010 and March 31st 2011. Observed in-flight error rates are compared with predictions based on ground test data obtained on flight lot devices operating under identical conditions.
Keywords
modules; radiation effects; semiconductor devices; space vehicle electronics; storage management chips; European Space Agency; PROBA-II satellite; PROBA-II technology demonstration module; SEE behavior; flight lot devices; ground test data; in-flight data analysis; memory devices; payload on-board; radiation effect monitoring; semiconductor devices; single event effect; Monitoring; Protons; Random access memory; Temperature distribution; Temperature measurement; Temperature sensors; Time division multiplexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131440
Filename
6131440
Link To Document