• DocumentCode
    3034838
  • Title

    PROBA-II Technology Demonstration Module in-flight data analysis

  • Author

    Harboe-Sørensen, R. ; Poivey, C. ; Zadeh, A. ; Keating, A. ; Fleurinck, N. ; Puimege, K. ; Guerre, F.-X. ; Lochon, F. ; Kaddour, M. ; Li, L. ; Walter, D.

  • Author_Institution
    RHS, Voorhout, Netherlands
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    581
  • Lastpage
    586
  • Abstract
    A Technology Demonstration Module (TDM) to monitor radiation effects in semiconductor devices was part of the payload on-board the European Space Agency (ESA) PROBA-II satellite. PROBA-II was launched on November 2nd 2009, into an 800 km polar orbit with the TDM switched-on since February 15th 2010. The TDM primarily carries modern memory devices in order to monitor and record their Single Event Effect (SEE) behavior in respect to orbital positions. This paper presents details of in-flight data obtained between February 15th 2010 and March 31st 2011. Observed in-flight error rates are compared with predictions based on ground test data obtained on flight lot devices operating under identical conditions.
  • Keywords
    modules; radiation effects; semiconductor devices; space vehicle electronics; storage management chips; European Space Agency; PROBA-II satellite; PROBA-II technology demonstration module; SEE behavior; flight lot devices; ground test data; in-flight data analysis; memory devices; payload on-board; radiation effect monitoring; semiconductor devices; single event effect; Monitoring; Protons; Random access memory; Temperature distribution; Temperature measurement; Temperature sensors; Time division multiplexing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131440
  • Filename
    6131440