Title :
NIST 10 V Programmable Josephson Voltage Standard System Using a Low-Capacity Cryocooler
Author :
Howe, L. ; Fox, Anna E. ; Rufenacht, Alain ; Burroughs, Charles J. ; Dresselhaus, Paul D. ; Benz, Samuel P. ; Schwall, Robert E.
Author_Institution :
Nat. Inst. of Stand. & Technol. (NIST), Gaithersburg, MD, USA
Abstract :
The recent shortage and increasing cost of liquid helium provides motivation for cryogen-free operation of superconducting devices such as NIST programmable Josephson voltage standard (PJVS) systems. However, operation on closed-cycle cryocoolers must not compromise the performance of the PJVS system. New cryogenic packaging and cryostat integration are presented that have been optimized for the NIST 10 V PJVS, demonstrating improved attenuation of coldhead temperature oscillations, and improvement of thermal conductances in the junction-to-coldhead path. When combined with an improved design of 10 V PJVS devices employing Nb/NbxSi1-x/Nb junctions with increased operating margins, we have operated a NIST PJVS at 10 V with over 1.32 mA current margins on a nominal 200 mW cryocooler using a 3.0 kW water-cooled compressor. The new cryo-package, in conjunction with the improved generation of chips, eliminates the need for liquid cryogens in applications using NIST 10 V PJVS systems.
Keywords :
compressors; cryostats; liquid helium; measurement standards; niobium alloys; oscillations; silicon alloys; superconducting arrays; superconducting junction devices; type II superconductors; voltage measurement; NIST PJVS system; NIST programmable Josephson voltage standard system; Nb-NbxSi1-x-Nb; coldhead temperature oscillations; cryocooler; cryogenic packaging; cryostat integration; current 1.32 mA; junction-to-coldhead path; liquid cryogen; power 200 mW; power 3.0 kW; superconducting device; thermal conductance; voltage 10 V; water cooled compressor; Electromagnetic heating; Helium; Liquids; Microwave circuits; Microwave oscillators; NIST; Josephson arrays; Standards; Superconducting device packaging; Superconducting integrated circuits; Voltage measurement; standards; superconducting device packaging; superconducting integrated circuits; voltage measurement;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2367531