An internal electrostatic charging test of circuit boards under electron beam

Author

Kim, Wousik ; Katz, Ira ; Green, Nelson W. ; Jun, Insoo

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

767

Lastpage

770

Abstract

Circuit boards with a grounded strip and a floating square trace were irradiated by a 0.85 MeV electron beam at the JPL Dynamitron. The potential on the floating square was monitored by measuring the current through a shunt resistor with very high resistance of 100 TΩ. The effects of a ground plane on the back of PCB and an exposed dielectric area on the potential of floating square were studied by testing corresponding circuit boards. The measured voltages were then compared with the simulated ones using a newly developed 3-D code, CB_IESD.

Keywords

electron beam effects; electrostatics; printed circuits; resistors; space vehicle electronics; JPL Dynamitron; PCB; circuit board; dielectric area; electron beam; floating square trace; grounded strip; internal electrostatic charging test; shunt resistor; Current measurement; Electric potential; Electron beams; Printed circuits; Relays; Resistors; Voltage measurement; CB_IESD; IESD; floating metal;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131449

Filename

6131449