Title :
An internal electrostatic charging test of circuit boards under electron beam
Author :
Kim, Wousik ; Katz, Ira ; Green, Nelson W. ; Jun, Insoo
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Circuit boards with a grounded strip and a floating square trace were irradiated by a 0.85 MeV electron beam at the JPL Dynamitron. The potential on the floating square was monitored by measuring the current through a shunt resistor with very high resistance of 100 TΩ. The effects of a ground plane on the back of PCB and an exposed dielectric area on the potential of floating square were studied by testing corresponding circuit boards. The measured voltages were then compared with the simulated ones using a newly developed 3-D code, CB_IESD.
Keywords :
electron beam effects; electrostatics; printed circuits; resistors; space vehicle electronics; JPL Dynamitron; PCB; circuit board; dielectric area; electron beam; floating square trace; grounded strip; internal electrostatic charging test; shunt resistor; Current measurement; Electric potential; Electron beams; Printed circuits; Relays; Resistors; Voltage measurement; CB_IESD; IESD; floating metal;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131449