• DocumentCode
    3035014
  • Title

    On the Sensibility of the "Arranged List of the Most a Priori Likely Tests" Algorithm

  • Author

    Kabat, Andrzej ; Guilloud, Frederic ; Pyndiah, Ramesh

  • Author_Institution
    GET / ENST Bretagne, CNRS TAMCIC (UMR 2872), 29238 BREST, Cedex 3, FRANCE. e-mail: andrzej.kabat@enst-bretagne.fr
  • fYear
    2007
  • fDate
    29-31 Oct. 2007
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper we study the sensibility of the recently proposed Arranged List of the Most a priori Likely Tests (ALMLT) algorithm to the real signal to noise ratio (SNR) of the received bits for a list of tests generated off-line at a given SNR. The ALMLT algorithm is an efficient method for reliability-based soft-decision decoding of long linear block codes. Based on order statistics and SNR, we define the mean bit reliabilities and use them to estimate the a priori weight of an error pattern. Each error pattern is represented by a test vector. All the test vectors are sorted according to the increasing order of their weights and saved in a list. Since these weights only depend on the estimated SNR, the generation of the list is performed once for all, off the transmission. The list of test vectors is then used to decode the received binary sequence as in the Ordered Statistic Decoding (OSD) algorithm. The ALMLT algorithm with the same maximal number of tests as the OSD(2) and while using the same stopping criterion, outperforms it, as illustrated by decoding the binary image of the (255, 239, 17) RS code and has a lower mean number of tests. Moreover, the algorithm designed for a given SNR proves to be insensible to small SNR variations when decoding the (255, 239, 17) RS code.
  • Keywords
    Algorithm design and analysis; Binary sequences; Block codes; Decoding; Error analysis; Signal generators; Signal to noise ratio; Statistical analysis; Testing; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference, 2007. MILCOM 2007. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    978-1-4244-1513-7
  • Electronic_ISBN
    978-1-4244-1513-7
  • Type

    conf

  • DOI
    10.1109/MILCOM.2007.4454794
  • Filename
    4454794