DocumentCode :
3035027
Title :
Recent developments in dram testing
Author :
Cockburn, Bruce E.
Author_Institution :
University of Alberta
fYear :
1996
fDate :
1996
Firstpage :
6
Lastpage :
7
Keywords :
Automatic testing; Costs; Design engineering; Electronic equipment testing; Failure analysis; Fault location; Production; Random access memory; Semiconductor device testing; Semiconductor memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN :
1087-4852
Print_ISBN :
0-8186-7466-0
Type :
conf
DOI :
10.1109/MTDT.1996.782483
Filename :
782483
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3035027
