• DocumentCode
    3035053
  • Title

    Built in self testing for detection of coupling faults in semiconductor memories

  • Author

    Karpovsky, Mark G. ; Das, Debaleena ; Vardhan, Harsh

  • Author_Institution
    Boston University
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    8
  • Lastpage
    14
  • Keywords
    Automatic testing; Built-in self-test; Decoding; Electrical fault detection; Fault detection; Logic arrays; Random access memory; Read-write memory; Semiconductor memory; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
  • ISSN
    1087-4852
  • Print_ISBN
    0-8186-7466-0
  • Type

    conf

  • DOI
    10.1109/MTDT.1996.782484
  • Filename
    782484
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3035053