Title :
Proposed on-chip test structure to quantify trap densities within flash meories
Author :
Verma, Vandana ; Swaneck, Andrew
Author_Institution :
Intel Corporation
Keywords :
Acceleration; Electric variables; Electron traps; Flash memory cells; Grounding; Nonvolatile memory; Scattering; Testing; Turning; Voltage;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782486
