DocumentCode :
3035141
Title :
Flash memory quality and reliability issues
Author :
Verma, Rajiv
Author_Institution :
Intel Corporation
fYear :
1996
fDate :
1996
Firstpage :
32
Lastpage :
36
Keywords :
Breakdown voltage; Drives; EPROM; Flash memory; Geometry; Nonvolatile memory; PROM; Power system reliability; Pulsed power supplies; Read only memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
ISSN :
1087-4852
Print_ISBN :
0-8186-7466-0
Type :
conf
DOI :
10.1109/MTDT.1996.782488
Filename :
782488
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3035141
