DocumentCode

3035141

Title

Flash memory quality and reliability issues

Author

Verma, Rajiv

Author_Institution

Intel Corporation

fYear

1996

fDate

1996

Firstpage

32

Lastpage

36

Keywords

Breakdown voltage; Drives; EPROM; Flash memory; Geometry; Nonvolatile memory; PROM; Power system reliability; Pulsed power supplies; Read only memory;

fLanguage

English

Publisher

ieee

Conference_Titel

Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on

ISSN

1087-4852

Print_ISBN

0-8186-7466-0

Type

conf

DOI

10.1109/MTDT.1996.782488

Filename

782488