• DocumentCode
    3035189
  • Title

    Flash memory technology - A review

  • Author

    Rajkanan, K.

  • Author_Institution
    Hyundai Electronics America
  • fYear
    1996
  • fDate
    13-14 Aug. 1996
  • Firstpage
    47
  • Lastpage
    48
  • Abstract
    The author very briefly outlines the history of flash memory development, the physics behind the operation of flash memory, various technological approaches, testing issues, and the fbture anticipated developments for flash memories.
  • Keywords
    Automatic testing; Consumer electronics; EPROM; Flash memory; Logic testing; Personal digital assistants; Power supplies; Sequential analysis; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
  • Conference_Location
    Singapore
  • ISSN
    1087-4852
  • Print_ISBN
    0-8186-7466-0
  • Type

    conf

  • DOI
    10.1109/MTDT.1996.782491
  • Filename
    782491
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3035189