DocumentCode
3035193
Title
The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components
Author
Zinchenko, V.F. ; Lavrentjev, K.V. ; Lipsky, A.K. ; Ulimov, V.N. ; Alexejev, N.N.
Author_Institution
Res. Inst. of Sci. Instrum., Lytkarino, Russia
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
734
Lastpage
738
Abstract
The possibilities of using of high-energy heavy ion synchrotron at the Institute of Theoretical and Experimental Physics, Moscow, for single event effects testing of modern electronic components are investigated. The basic problems and offered approaches to their solution are considered. The obtained experimental data are discussed.
Keywords
integrated circuit testing; radiation effects; synchrotrons; ITEP; Institute of Theoretical and Experimental Physics; Moscow; SEE testing; electronic component testing; high-energy heavy ion synchrotron; integrated circuit testing; single event effect testing; Integrated circuits; Ion beams; Ions; Silver; Synchrotrons; Testing; Linear energy transfer; high-energy ions; integrated circuit; sensitive volume; single event effects; straggling;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131457
Filename
6131457
Link To Document