Title :
A synthesizable ram bist circuit for applying an O(n log2 n) test that detects scrambled static pattern-sensitive faults
Author :
Cockburn, Bruce F. ; Sarda, Deepak P.
Author_Institution :
University of Alberta
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Fault detection; Fault diagnosis; Logic testing; Read-write memory;
Conference_Titel :
Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on
Print_ISBN :
0-8186-7466-0
DOI :
10.1109/MTDT.1996.782493
