DocumentCode

3035276

Title

Methods for memory test time reduction

Author

Wu, Wen-Jer ; Tang, Chuan Yi ; Lin, Mike Y.

Author_Institution

National Tsing-Hua University

fYear

1996

fDate

1996

Firstpage

64

Lastpage

71

Keywords

Algorithm design and analysis; Assembly; Computer science; Failure analysis; Heuristic algorithms; Industrial relations; Polynomials; Testing; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Memory Technology, Design and Testing, 1996. Records of the 1996 IEEE International Workshop on

ISSN

1087-4852

Print_ISBN

0-8186-7466-0

Type

conf

DOI

10.1109/MTDT.1996.782494

Filename

782494