• DocumentCode
    3035493
  • Title

    Extended scalability and functionalities of MRAM based on thermally assisted writing

  • Author

    Dieny, B. ; Sousa, R. ; Bandiera, S. ; Souza, M. Castro ; Auffret, S. ; Rodmacq, B. ; Nozieres, J.P. ; Hérault, J. ; Gapihan, E. ; Prejbeanu, I.L. ; Ducruet, C. ; Portemont, C. ; Mackay, K. ; Cambou, B.

  • Author_Institution
    Grenoble-INP, INAC, SPINTEC, UJF, Grenoble, France
  • fYear
    2011
  • fDate
    5-7 Dec. 2011
  • Abstract
    MRAM are already used in low density applications such as microcontrollers or for spatial/avionics applications where they benefit from their radiation hardness. Thermally assisted writing allows extending the downsize scalability of both FIMS and STT-MRAM below the 20nm node. Within a few years, MRAM can play an important role in the memory hierarchy of electronic circuits. They may be first used as DRAM replacement below the 20nm node and in a second step even closer the logic units. Besides memories, TAS-FIMS with soft reference allows to introduce new functionalities such as the Match In Place particularly promising for security and routers applications. This work has been partly supported by the European Commission through the ERC grant HYMAGINE.
  • Keywords
    DRAM chips; MRAM devices; radiation hardening (electronics); DRAM replacement; ERC grant HYMAGINE; European Commission; FIMS; STT-MRAM; TAS-FIMS; low density application; microcontroller; radiation hardness; spatial-avionic application; thermally assisted writing; Heating; Magnetic anisotropy; Magnetic switching; Magnetic tunneling; Magnetization; Switches; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2011 IEEE International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4577-0506-9
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2011.6131471
  • Filename
    6131471