DocumentCode
3035493
Title
Extended scalability and functionalities of MRAM based on thermally assisted writing
Author
Dieny, B. ; Sousa, R. ; Bandiera, S. ; Souza, M. Castro ; Auffret, S. ; Rodmacq, B. ; Nozieres, J.P. ; Hérault, J. ; Gapihan, E. ; Prejbeanu, I.L. ; Ducruet, C. ; Portemont, C. ; Mackay, K. ; Cambou, B.
Author_Institution
Grenoble-INP, INAC, SPINTEC, UJF, Grenoble, France
fYear
2011
fDate
5-7 Dec. 2011
Abstract
MRAM are already used in low density applications such as microcontrollers or for spatial/avionics applications where they benefit from their radiation hardness. Thermally assisted writing allows extending the downsize scalability of both FIMS and STT-MRAM below the 20nm node. Within a few years, MRAM can play an important role in the memory hierarchy of electronic circuits. They may be first used as DRAM replacement below the 20nm node and in a second step even closer the logic units. Besides memories, TAS-FIMS with soft reference allows to introduce new functionalities such as the Match In Place particularly promising for security and routers applications. This work has been partly supported by the European Commission through the ERC grant HYMAGINE.
Keywords
DRAM chips; MRAM devices; radiation hardening (electronics); DRAM replacement; ERC grant HYMAGINE; European Commission; FIMS; STT-MRAM; TAS-FIMS; low density application; microcontroller; radiation hardness; spatial-avionic application; thermally assisted writing; Heating; Magnetic anisotropy; Magnetic switching; Magnetic tunneling; Magnetization; Switches; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2011 IEEE International
Conference_Location
Washington, DC
ISSN
0163-1918
Print_ISBN
978-1-4577-0506-9
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2011.6131471
Filename
6131471
Link To Document