• DocumentCode
    303561
  • Title

    A comparison of exact TM plane wave diffraction by coated wedges and impedance wedges

  • Author

    Andersen, L.S. ; Breinbjerg, O.

  • Author_Institution
    Electromagn. Inst., Tech. Univ., Lyngby, Denmark
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 July 1996
  • Firstpage
    494
  • Abstract
    The purpose of this work is to numerically investigate the accuracy of the standard impedance boundary condition (SIBC) approximation for edge diffraction. To this end, we compare the scattering by coated wedges and SIBC wedges for which the diffracted field from a single edge can be observed without interference from direct fields or reflected fields. Results have been obtained in the case of illumination by a transverse magnetic (TM) uniform plane wave. The analysis of the coated wedge is based on an integral equation formulation combined with a hybrid technique, while the analysis of the SIBC wedge is based on Maliuzhinets´ solution. Comparisons have been carried out for a series of configurations including lossy coatings as well as lossless coatings permitting unattenuated propagation of surface waves. The results show that the presence of an edge in a coated structure does not necessarily make the SIBC approximation inapplicable.
  • Keywords
    electric impedance; electromagnetic wave diffraction; electromagnetic wave scattering; integral equations; numerical analysis; Maliuzhinets´ solution; SIBC approximation; TM plane wave diffraction; coated wedges; edge diffraction; electromagnetic scattering; impedance wedges; integral equation formulation; lossless coatings; lossy coatings; numerical solution; standard impedance boundary condition; surface wave propagation; transverse magnetic uniform plane wave; Boundary conditions; Coatings; Diffraction; Impedance; Integral equations; Interference; Lighting; Magnetic analysis; Propagation losses; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-3216-4
  • Type

    conf

  • DOI
    10.1109/APS.1996.549645
  • Filename
    549645