DocumentCode :
303561
Title :
A comparison of exact TM plane wave diffraction by coated wedges and impedance wedges
Author :
Andersen, L.S. ; Breinbjerg, O.
Author_Institution :
Electromagn. Inst., Tech. Univ., Lyngby, Denmark
Volume :
1
fYear :
1996
fDate :
21-26 July 1996
Firstpage :
494
Abstract :
The purpose of this work is to numerically investigate the accuracy of the standard impedance boundary condition (SIBC) approximation for edge diffraction. To this end, we compare the scattering by coated wedges and SIBC wedges for which the diffracted field from a single edge can be observed without interference from direct fields or reflected fields. Results have been obtained in the case of illumination by a transverse magnetic (TM) uniform plane wave. The analysis of the coated wedge is based on an integral equation formulation combined with a hybrid technique, while the analysis of the SIBC wedge is based on Maliuzhinets´ solution. Comparisons have been carried out for a series of configurations including lossy coatings as well as lossless coatings permitting unattenuated propagation of surface waves. The results show that the presence of an edge in a coated structure does not necessarily make the SIBC approximation inapplicable.
Keywords :
electric impedance; electromagnetic wave diffraction; electromagnetic wave scattering; integral equations; numerical analysis; Maliuzhinets´ solution; SIBC approximation; TM plane wave diffraction; coated wedges; edge diffraction; electromagnetic scattering; impedance wedges; integral equation formulation; lossless coatings; lossy coatings; numerical solution; standard impedance boundary condition; surface wave propagation; transverse magnetic uniform plane wave; Boundary conditions; Coatings; Diffraction; Impedance; Integral equations; Interference; Lighting; Magnetic analysis; Propagation losses; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-3216-4
Type :
conf
DOI :
10.1109/APS.1996.549645
Filename :
549645
Link To Document :
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