Title :
State of near-field metrology using the Near-Field Measurement Laboratory at Lockheed Martin, Denver
Author_Institution :
Lockheed Martin, Denver, CO, USA
Abstract :
Antenna metrology at the Antenna Test Laboratories is extensive and state-of-the-art in many areas. The facilities include two 30 foot rectangular chambers, a 75 foot tapered chamber, several outdoor ranges up to 1100 feet, a large compact range with a 12 foot quiet zone and the Near Field Measurement Laboratory (NFML). Antenna measurements have been performed in these facilities from 100 MHz to 40 GHz. The NFML was built in 1978 as the premier facility for performing extremely accurate high gain antenna metrology. The NFML is the largest near field scanner in existence, and applied near field techniques on a massive scale shortly after their initial development. The scanner is capable of characterizing antenna apertures up to 16.5 meters in diameter (54 feet) with the maximum physical scan size of 23.7/spl times/23.7 meters (78/spl times/78 feet). As antenna technology evolved since this facility was built it has begun to standardize on many of the features used to make this facility the reliable, accurate instrument it still is today. This paper discusses the power of near-field metrology, industry trends, and instrumentation for near-field measurement facilities of the future.
Keywords :
antenna radiation patterns; antenna testing; instrumentation; measurement standards; 100 MHz to 40 GHz; 1100 feet; 12 feet; 23.7 m; 27 ft; 30 ft; 75 ft; 78 feet; 8.25 m; Antenna Test Laboratories; Denver; Lockheed Martin; Near-Field Measurement Laboratory; antenna apertures; antenna technology; high gain antenna metrology; industry trends; instrumentation; large compact range; measurement standards; near field scanner; near field techniques; near-field measurement facilities; near-field metrology; outdoor ranges; physical scan size; quiet zone; rectangular chambers; tapered chamber; Antenna measurements; Aperture antennas; Foot; Instruments; Laboratories; Metrology; Performance evaluation; Performance gain; Power measurement; Testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-3216-4
DOI :
10.1109/APS.1996.549657