DocumentCode :
3036098
Title :
Designing the relative impact of thickness/composition changes in selective area organometallic epitaxy for monolithic integration applications
Author :
Ougazzaden, A. ; Silvestre, L. ; Mircea, A. ; Bouadma, N. ; Patriarche, G. ; Juhel, M.
Author_Institution :
PAB, CNET, Bagneux, France
fYear :
1997
fDate :
11-15 May 1997
Firstpage :
598
Lastpage :
601
Abstract :
Selective area growth (SAG) has been performed with atmospheric pressure MOVPE. We have studied growth rate enhancement and composition variation as a function of the mask and opening widths. Two distinct behaviours, depending on the opening width, have been identified. For opening regions larger than 5 μm, an overgrowth occurs near the edge of the mask and the relative variation of III elements in the centre is small and independent of the mask width. On the other hand for narrow opening regions (<3 μm) the growth has a triangular shape with smooth [111] facets. In that case the relative variation of III elements in the centre increases linearly with the mask width. Moreover we have grown a multiquantum well structure laser in a 2 μm opening region (6 lattice matched InGaAsP wells and barriers at 1.55 μm and 1.2 μm respectively). Good material quality and lasers characteristics have been obtained
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; integrated optics; masks; optical fabrication; photoluminescence; quantum well lasers; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; 1.2 mum; 1.55 mum; 2 to 5 mum; III elements; InGaAsP; SAG; atmospheric pressure MOVPE; barriers; composition variation; growth rate enhancement; lasers characteristics; lattice matched InGaAsP wells; mask width; material quality; monolithic integration applications; multiquantum well structure laser; opening regions; opening widths; overgrowth; photoluminescence intensity; selective area growth; selective area organometallic epitaxy; smooth [111] facets; thickness/composition changes; triangular shape; Chemical elements; Chemical vapor deposition; Computational modeling; Dielectric substrates; Epitaxial growth; Epitaxial layers; Gas lasers; Integrated optics; Monolithic integrated circuits; Shape measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location :
Cape Cod, MA
ISSN :
1092-8669
Print_ISBN :
0-7803-3898-7
Type :
conf
DOI :
10.1109/ICIPRM.1997.600237
Filename :
600237
Link To Document :
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