• DocumentCode
    3036098
  • Title

    Designing the relative impact of thickness/composition changes in selective area organometallic epitaxy for monolithic integration applications

  • Author

    Ougazzaden, A. ; Silvestre, L. ; Mircea, A. ; Bouadma, N. ; Patriarche, G. ; Juhel, M.

  • Author_Institution
    PAB, CNET, Bagneux, France
  • fYear
    1997
  • fDate
    11-15 May 1997
  • Firstpage
    598
  • Lastpage
    601
  • Abstract
    Selective area growth (SAG) has been performed with atmospheric pressure MOVPE. We have studied growth rate enhancement and composition variation as a function of the mask and opening widths. Two distinct behaviours, depending on the opening width, have been identified. For opening regions larger than 5 μm, an overgrowth occurs near the edge of the mask and the relative variation of III elements in the centre is small and independent of the mask width. On the other hand for narrow opening regions (<3 μm) the growth has a triangular shape with smooth [111] facets. In that case the relative variation of III elements in the centre increases linearly with the mask width. Moreover we have grown a multiquantum well structure laser in a 2 μm opening region (6 lattice matched InGaAsP wells and barriers at 1.55 μm and 1.2 μm respectively). Good material quality and lasers characteristics have been obtained
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; integrated optics; masks; optical fabrication; photoluminescence; quantum well lasers; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; 1.2 mum; 1.55 mum; 2 to 5 mum; III elements; InGaAsP; SAG; atmospheric pressure MOVPE; barriers; composition variation; growth rate enhancement; lasers characteristics; lattice matched InGaAsP wells; mask width; material quality; monolithic integration applications; multiquantum well structure laser; opening regions; opening widths; overgrowth; photoluminescence intensity; selective area growth; selective area organometallic epitaxy; smooth [111] facets; thickness/composition changes; triangular shape; Chemical elements; Chemical vapor deposition; Computational modeling; Dielectric substrates; Epitaxial growth; Epitaxial layers; Gas lasers; Integrated optics; Monolithic integrated circuits; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1997., International Conference on
  • Conference_Location
    Cape Cod, MA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-3898-7
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1997.600237
  • Filename
    600237