• DocumentCode
    3036489
  • Title

    Enhanced angle sensitive pixels for light field imaging

  • Author

    Sivaramakrishnan, Sriram ; Wang, Albert ; Gill, Patrick R. ; Molnar, Alyosha

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    2011
  • fDate
    5-7 Dec. 2011
  • Abstract
    Previously demonstrated angle sensitive pixels (ASPs) have been shown to enable integrated digital light-field imaging in CMOS, but suffer from significantly reduced pixel quantum efficiency and increased sensor size. This work demonstrates ASP devices that use phase gratings and a pair of interleaved diodes to double pixel density and improve quantum efficiency by a factor of 4.
  • Keywords
    CMOS image sensors; diffraction gratings; semiconductor diodes; ASP enhancement; CMOS image sensor; angle sensitive pixel enhancement; double pixel density; integrated digital light-field imaging; interleaved diode; phase grating; pixel quantum efficiency; CMOS integrated circuits; Diffraction; Diffraction gratings; Gratings; Image sensors; Metals; Photodiodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2011 IEEE International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4577-0506-9
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2011.6131516
  • Filename
    6131516
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3036489